Facilities > RF Test & Applications

LOAD-PULL MEASUREMENT SYSTEM FROM 0.8 – 18 GHz

Type

- Hardware

Description

The load-pull measurement system provides the capability to characterize the semiconductor device for small-signal analysis, power analysis and noise figure at various input and output impedances. This characterization process is really required for the LNA and PA design purposes. The load-pull measurement process can be done accurately with the RFOW method using high precision tuner and high frequency probe-station which can support operating frequency up to 18 GHz.

System Features

The Load-pull measurement system consists of dedicated anti-vibration platform, Network Analyzer, RF Power Meter and RF Signal Generator which can perform measurement and analysis up to 18 GHz. The software that is integrated with the system is capable to display the power and noise contour which indicate the optimum impedance for matching condition. All the measurement can support the measurement on wafer and package system.

System Capability

Anti-vibration system to support on-wafer measurement. Source and Load tuning from 0.8 GHz to 18 GHz Network parameter (S-Parameter) measurement up to 40 GHz RF Power Meter up to 44 dBm (25 W) at 18 GHz Noise Figure measurement up to 26 GHz.

Sample Information

Sample: Chip, wafer and die Size (wafer): 0.5cm to 15.0cm RF Probe tip (On-wafer): GSG configuration (up to 50 GHz); Pitch: 50 um, 100um, 150 um, 200 um and 450um.

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