List of Testing Services
- Type: Semiconductor Device Characterization
- Location: RF Test Laboratory TMRND-UKM
- Methods Available:
- On-wafer Technique
- On-packaged Technique
- On-board / Carrier Substrate Technique
- Test Capability:
- Low Frequency (DC) Parametric Measurement
- Resistance Measurement
- Capacitance Measurement
- Diode and Transistor Measurement
- Output Characteristic (Ids-Vds)
- Transfer Characteristic (Ids-Vgs)
- Transconductance (gm)
- Threshold Voltage (Vth)
- Breakdown Voltage (Vb)
- High Frequency (RF) Measurement
- Passive Device (Inductor, Capacitor, Resistor, Filter, LTCC based)
- Active Device (Diode, Transistor)
- MMIC Device (LNA, PA, Switch)
- Amplifier
- Mixer
- Power and Spectrum Measurement (P1dB, OIP3)
- Load-Pull Measurement
+ HIGH PRECISION CV-IV MEASUREMENT SYSTEM
+ RF & MICROWAVE MEASUREMENT SYSTEM FROM DC – 40 GHz
+ LOAD-PULL MEASUREMENT SYSTEM FROM 0.8 – 18 GHz